Yield Advisor 1.2

Yield Advisor by Orbotech is a yield analytics and decision-support solution that helps electronics manufacturers quickly identify, prioritize, and resolve yield limiters. By unifying inspection, test, and process data—including inputs from Orbotech AOI/AVI/DI systems and other factory sources—it delivers real-time visibility, deep defect analysis, and clear guidance for process improvement across PCB, IC substrate, and display production.

Key capabilities:

• Unified data hub: Aggregates high-volume defect, image, and process data across lines and sites.
• Interactive analytics: Dashboards, Pareto charts, trends, heatmaps, and layer-to-layer correlation to speed root-cause analysis.
• SPC and alerts: Monitors key metrics, flags out-of-control conditions, and issues automated notifications.
• Recipe and process optimization: Provides insights to tune exposure, etch, imaging, and inspection parameters, with closed-loop feedback to Orbotech tools.
• Classification support: Rules-based and optional machine learning–assisted defect binning reduces false calls and focuses attention on critical defects.
• Enterprise integration: Connects with MES/ERP and common data formats, featuring role-based access control and audit trails.

Benefits:

• Higher first-pass yield and throughput
• Faster new-product ramps and process stabilization
• Reduced scrap, rework, and engineering time
• Consistent, data-driven decisions across teams and sites

Designed to scale from a single line to multi-factory operations, Yield Advisor turns complex manufacturing data into actionable insights that improve yield, cost, and time to market.

Yield Advisor is developed by Orbotech. The most popular version of this product among our users is 1.2. The name of the program executable file is YieldAdvisor.exe.